Random telegraph noise in metallic single-walled carbon nanotubes

Hyun Jong Chung; Tae Woo Uhm; Sung Won Kim; Young Gyu You; Sang Wook Lee; Sung Ho Jhang; Eleanor E.B. Campbell; Yung Woo Park

doi:10.1063/1.4876443

Random telegraph noise in metallic single-walled carbon nanotubes

Hyun Jong Chung, Tae Woo Uhm, Sung Won Kim, Young Gyu You, Sang Wook Lee, Sung Ho Jhang, Eleanor E.B. Campbell, Yung Woo Park

Department of Physics

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3 Scopus citations

Abstract

We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.

Original language	English
Article number	193102
Journal	Applied Physics Letters
Volume	104
Issue number	19
DOIs	https://doi.org/10.1063/1.4876443
State	Published - 12 May 2014

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title = "Random telegraph noise in metallic single-walled carbon nanotubes",

abstract = "We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.",

author = "Chung, {Hyun Jong} and {Woo Uhm}, Tae and {Won Kim}, Sung and {Gyu You}, Young and {Wook Lee}, Sang and {Ho Jhang}, Sung and Campbell, {Eleanor E.B.} and {Woo Park}, Yung",

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AU - Chung, Hyun Jong

AU - Woo Uhm, Tae

AU - Won Kim, Sung

AU - Gyu You, Young

AU - Wook Lee, Sang

AU - Ho Jhang, Sung

AU - Campbell, Eleanor E.B.

AU - Woo Park, Yung

PY - 2014/5/12

Y1 - 2014/5/12

N2 - We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.

AB - We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.

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VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 19

M1 - 193102

ER -

Random telegraph noise in metallic single-walled carbon nanotubes

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