Raman study of the 90° grain boundaries in YBa2Cu3O7-δ thin films

In Sang Yang, Bo Youn Chang, Gun Yong Sung

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YBa2Cu3O7-δ (YBCO) films containing two different types of 90° grain boundaries were fabricated on the same substrates. Raman spectra from several parts of the basal-plane-faced tilt (TL) grain boundaries were measured and compared with those from the twist (TW) grain boundaries. The Raman results show that I(500)/I(340), the relative intensity of the A1g mode near 500 cm-1 with respect to that of the B1g mode near 340 cm-1, is suppressed in the TL boundaries, relative to the TW boundaries. The results can be interpreted to mean that the stress is stronger in the TL boundaries than in the TW boundaries. This may offer an alternative explanation for the weak-link behavior of the step-edge Josephson junctions.

Original languageEnglish
Pages (from-to)75-80
Number of pages6
JournalPhysica C: Superconductivity and its Applications
Issue number1-2
StatePublished - 1999

Bibliographical note

Funding Information:
I.S.Y. greatly appreciates the support from the Electronics and Telecommunications Research Institute (ETRI) of Korea, Basic Science Research Institute Project No. BSRI-97-2428, and the grant no. 95-0702-03-01-3 of the Korea Science & Engineering Foundation.


  • 90° grain boundaries
  • Raman spectra
  • Stress
  • YBaCuO film


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