Raman study of the 90° grain boundaries in YBa2Cu3O7-δ thin films

In Sang Yang; Bo Youn Chang; Gun Yong Sung

doi:10.1016/S0921-4534(98)00636-4

Raman study of the 90° grain boundaries in YBa₂Cu₃O_7-δ thin films

In Sang Yang, Bo Youn Chang, Gun Yong Sung

Department of Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

YBa₂Cu₃O_7-δ (YBCO) films containing two different types of 90° grain boundaries were fabricated on the same substrates. Raman spectra from several parts of the basal-plane-faced tilt (TL) grain boundaries were measured and compared with those from the twist (TW) grain boundaries. The Raman results show that I(500)/I(340), the relative intensity of the A_1g mode near 500 cm^-1 with respect to that of the B_1g mode near 340 cm^-1, is suppressed in the TL boundaries, relative to the TW boundaries. The results can be interpreted to mean that the stress is stronger in the TL boundaries than in the TW boundaries. This may offer an alternative explanation for the weak-link behavior of the step-edge Josephson junctions.

Original language	English
Pages (from-to)	75-80
Number of pages	6
Journal	Physica C: Superconductivity and its Applications
Volume	311
Issue number	1-2
DOIs	https://doi.org/10.1016/S0921-4534(98)00636-4
State	Published - 1999

Bibliographical note

Funding Information:
I.S.Y. greatly appreciates the support from the Electronics and Telecommunications Research Institute (ETRI) of Korea, Basic Science Research Institute Project No. BSRI-97-2428, and the grant no. 95-0702-03-01-3 of the Korea Science & Engineering Foundation.

Keywords

90° grain boundaries
Raman spectra
Stress
YBaCuO film

Access to Document

10.1016/S0921-4534(98)00636-4

Cite this

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title = "Raman study of the 90° grain boundaries in YBa2Cu3O7-δ thin films",

abstract = "YBa2Cu3O7-δ (YBCO) films containing two different types of 90° grain boundaries were fabricated on the same substrates. Raman spectra from several parts of the basal-plane-faced tilt (TL) grain boundaries were measured and compared with those from the twist (TW) grain boundaries. The Raman results show that I(500)/I(340), the relative intensity of the A1g mode near 500 cm-1 with respect to that of the B1g mode near 340 cm-1, is suppressed in the TL boundaries, relative to the TW boundaries. The results can be interpreted to mean that the stress is stronger in the TL boundaries than in the TW boundaries. This may offer an alternative explanation for the weak-link behavior of the step-edge Josephson junctions.",

keywords = "90° grain boundaries, Raman spectra, Stress, YBaCuO film",

author = "Yang, {In Sang} and Chang, {Bo Youn} and Sung, {Gun Yong}",

note = "Funding Information: I.S.Y. greatly appreciates the support from the Electronics and Telecommunications Research Institute (ETRI) of Korea, Basic Science Research Institute Project No. BSRI-97-2428, and the grant no. 95-0702-03-01-3 of the Korea Science & Engineering Foundation.",

year = "1999",

doi = "10.1016/S0921-4534(98)00636-4",

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T1 - Raman study of the 90° grain boundaries in YBa2Cu3O7-δ thin films

AU - Yang, In Sang

AU - Chang, Bo Youn

AU - Sung, Gun Yong

N1 - Funding Information: I.S.Y. greatly appreciates the support from the Electronics and Telecommunications Research Institute (ETRI) of Korea, Basic Science Research Institute Project No. BSRI-97-2428, and the grant no. 95-0702-03-01-3 of the Korea Science & Engineering Foundation.

PY - 1999

Y1 - 1999

N2 - YBa2Cu3O7-δ (YBCO) films containing two different types of 90° grain boundaries were fabricated on the same substrates. Raman spectra from several parts of the basal-plane-faced tilt (TL) grain boundaries were measured and compared with those from the twist (TW) grain boundaries. The Raman results show that I(500)/I(340), the relative intensity of the A1g mode near 500 cm-1 with respect to that of the B1g mode near 340 cm-1, is suppressed in the TL boundaries, relative to the TW boundaries. The results can be interpreted to mean that the stress is stronger in the TL boundaries than in the TW boundaries. This may offer an alternative explanation for the weak-link behavior of the step-edge Josephson junctions.

AB - YBa2Cu3O7-δ (YBCO) films containing two different types of 90° grain boundaries were fabricated on the same substrates. Raman spectra from several parts of the basal-plane-faced tilt (TL) grain boundaries were measured and compared with those from the twist (TW) grain boundaries. The Raman results show that I(500)/I(340), the relative intensity of the A1g mode near 500 cm-1 with respect to that of the B1g mode near 340 cm-1, is suppressed in the TL boundaries, relative to the TW boundaries. The results can be interpreted to mean that the stress is stronger in the TL boundaries than in the TW boundaries. This may offer an alternative explanation for the weak-link behavior of the step-edge Josephson junctions.

KW - 90° grain boundaries

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KW - Stress

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