Progressive Degradation Without Physical Failure During Mounting Due to Soft Overstress in Compound HBT for RF, Mobile, and Automotive Applications

Hyeokjae Lee, Sanggi Ko, Ho Joon Suh, Gina Jeong, Jung Han Yeo, Hye Min Park, Hee Kyeong Kim, Jong Kwan Kim, Sung S. Chung, Youngboo Kim, Jisun Park, Hyungsoon Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Engineering & Materials Science