Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates
- Hyeokjae Lee
- , Dong Sung Kim
- , Jae Young Noh
- , Youngboo Kim
- , Jisun Park
- , Hyungsoon Shin
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Scopus
citations