Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates

Hyeokjae Lee, Dong Sung Kim, Jae Young Noh, Youngboo Kim, Jisun Park, Hyungsoon Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Material Science