Abstract
Ellipsometry was used to observe the in situ electrochemical redox processes of a thionine film that was electrochernically deposited (thickness > 70 nm) on a glassy carbon electrode at 1.2 V from a 0.05 M H2SO4 solution containing 50 μM thionine. To determine the spatial distribution of the oxidized and reduced states during the reduction and oxidation of the film, the conversion process was simulated by a multilayer film model, where 8 or 9 discrete film layers were considered. Such simulations of the ellipsometric results show that the redox conversion of a thionine film proceeds from the electrode/film interface towards the solution and is controlled by electron hopping.
Original language | English |
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Pages (from-to) | 239-252 |
Number of pages | 14 |
Journal | Journal of Electroanalytical Chemistry |
Volume | 282 |
Issue number | 1-2 |
DOIs | |
State | Published - 14 Oct 1990 |
Bibliographical note
Funding Information:of this research by the National Science Foundation the Robert A. Welch Foundation is gratefully acknowledged.