Polarization interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal

S. H. Han, J. W. Wu

Research output: Contribution to conferencePaperpeer-review

Abstract

Single beam polarization interferometry was introduced to measure the Pockels coefficients in a BSO single crystal. The linear superposition principle of the induced birefringence and the optical activity was employed in the analysis of the Pockels effect measurement.

Original languageEnglish
Pages83-85
Number of pages3
StatePublished - 2000
EventNonlinear Optics: Materials, Fundamentals, and Applications - Kaua'i-Lihue, HI, USA
Duration: 6 Aug 200010 Aug 2000

Conference

ConferenceNonlinear Optics: Materials, Fundamentals, and Applications
CityKaua'i-Lihue, HI, USA
Period6/08/0010/08/00

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