Piezoelectric and electromechanical properties of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3(65%)-PbTiO3(35%) thin films observed by scanning force microscopy

J. H. Lee; Y. J. Oh; T. Y. Kim; M. R. Choi; W. Jo

doi:10.1016/j.ultramic.2007.02.039

Piezoelectric and electromechanical properties of relaxor ferroelectric Pb(Mg_1/3Nb_2/3)O₃(65%)-PbTiO₃(35%) thin films observed by scanning force microscopy

J. H. Lee, Y. J. Oh, T. Y. Kim, M. R. Choi, W. Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Relaxor ferroelectric PbMg_1/3Nb_2/3O₃(65%)-PbTiO₃(35%) (PMN-35PT) thin films were grown by a sol-gel method on Pt(1 1 1)/TiO₂/SiO₂/Si(1 0 0) substrates. Piezoresponse and poling behavior appear to have a relation with the relaxor behavior of the materials. Piezoelectric images were studied in a number of regions on the films with subsequent statistical analysis of the obtained data using the contact mode of scanning force microscopy. Hysteresis loops were observed with external field applied over a wide range of the vibration frequency. The piezoelectric coefficient, d₃₃, and the crystallographic electrostrictive constant, Q₃₃, were also determined as 100 pm/V and 2.8×10^-3 C^-2 m⁴, respectively.

Original language	English
Pages (from-to)	954-957
Number of pages	4
Journal	Ultramicroscopy
Volume	107
Issue number	10-11
DOIs	https://doi.org/10.1016/j.ultramic.2007.02.039
State	Published - Oct 2007

Bibliographical note

Funding Information:
This research was supported by a grant (code #: 065K1501-02520) from ‘Center for Nanostructured Materials Technology’ under ‘21st Century Frontier R&D Programs’ of the Ministry of Science and Technology, Korea.

Keywords

018
027
PMN-PT
Piezoresponse
Scanning force microscopy

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10.1016/j.ultramic.2007.02.039

Cite this

@article{efa6d0d192cb4ca3bdf4b338d1248c9b,

title = "Piezoelectric and electromechanical properties of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3(65%)-PbTiO3(35%) thin films observed by scanning force microscopy",

abstract = "Relaxor ferroelectric PbMg1/3Nb2/3O3(65%)-PbTiO3(35%) (PMN-35PT) thin films were grown by a sol-gel method on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates. Piezoresponse and poling behavior appear to have a relation with the relaxor behavior of the materials. Piezoelectric images were studied in a number of regions on the films with subsequent statistical analysis of the obtained data using the contact mode of scanning force microscopy. Hysteresis loops were observed with external field applied over a wide range of the vibration frequency. The piezoelectric coefficient, d33, and the crystallographic electrostrictive constant, Q33, were also determined as 100 pm/V and 2.8×10-3 C-2 m4, respectively.",

keywords = "018, 027, PMN-PT, Piezoresponse, Scanning force microscopy",

author = "Lee, {J. H.} and Oh, {Y. J.} and Kim, {T. Y.} and Choi, {M. R.} and W. Jo",

note = "Funding Information: This research was supported by a grant (code #: 065K1501-02520) from {\textquoteleft}Center for Nanostructured Materials Technology{\textquoteright} under {\textquoteleft}21st Century Frontier R&D Programs{\textquoteright} of the Ministry of Science and Technology, Korea.",

year = "2007",

month = oct,

doi = "10.1016/j.ultramic.2007.02.039",

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journal = "Ultramicroscopy",

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AU - Lee, J. H.

AU - Oh, Y. J.

AU - Kim, T. Y.

AU - Choi, M. R.

AU - Jo, W.

N1 - Funding Information: This research was supported by a grant (code #: 065K1501-02520) from ‘Center for Nanostructured Materials Technology’ under ‘21st Century Frontier R&D Programs’ of the Ministry of Science and Technology, Korea.

PY - 2007/10

Y1 - 2007/10

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AB - Relaxor ferroelectric PbMg1/3Nb2/3O3(65%)-PbTiO3(35%) (PMN-35PT) thin films were grown by a sol-gel method on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates. Piezoresponse and poling behavior appear to have a relation with the relaxor behavior of the materials. Piezoelectric images were studied in a number of regions on the films with subsequent statistical analysis of the obtained data using the contact mode of scanning force microscopy. Hysteresis loops were observed with external field applied over a wide range of the vibration frequency. The piezoelectric coefficient, d33, and the crystallographic electrostrictive constant, Q33, were also determined as 100 pm/V and 2.8×10-3 C-2 m4, respectively.

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