Photogenerated plasmons in GaAs1-xBix

S. Yoon; M. J. Seong; B. Fluegel; A. Mascarenhas; S. Tixier; T. Tiedje

doi:10.1063/1.2770760

Photogenerated plasmons in GaAs_1-xBi_x

S. Yoon, M. J. Seong, B. Fluegel, A. Mascarenhas, S. Tixier, T. Tiedje

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Light scattering measurements in the dilute isoelectronically doped alloy Ga As1-x Bix reveal a large free electron population photogenerated by continuous-wave laser excitation at low temperature. Low-temperature time-resolved photoluminescence of the bismuth related near-band-gap states show carrier lifetimes of several nanoseconds. The authors attribute this to trapping of photoexcited holes at bismuth pair or cluster states located near the valence band maximum.

Original language	English
Article number	082101
Journal	Applied Physics Letters
Volume	91
Issue number	8
DOIs	https://doi.org/10.1063/1.2770760
State	Published - 2007

Bibliographical note

Funding Information:
The authors acknowledge the financial support of the Department of Energy, Office of Science, Basic Energy Sciences under Grant No. DE-AC36-83CH10093.

Access to Document

10.1063/1.2770760

Cite this

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abstract = "Light scattering measurements in the dilute isoelectronically doped alloy Ga As1-x Bix reveal a large free electron population photogenerated by continuous-wave laser excitation at low temperature. Low-temperature time-resolved photoluminescence of the bismuth related near-band-gap states show carrier lifetimes of several nanoseconds. The authors attribute this to trapping of photoexcited holes at bismuth pair or cluster states located near the valence band maximum.",

author = "S. Yoon and Seong, {M. J.} and B. Fluegel and A. Mascarenhas and S. Tixier and T. Tiedje",

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AU - Seong, M. J.

AU - Fluegel, B.

AU - Mascarenhas, A.

AU - Tixier, S.

AU - Tiedje, T.

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AB - Light scattering measurements in the dilute isoelectronically doped alloy Ga As1-x Bix reveal a large free electron population photogenerated by continuous-wave laser excitation at low temperature. Low-temperature time-resolved photoluminescence of the bismuth related near-band-gap states show carrier lifetimes of several nanoseconds. The authors attribute this to trapping of photoexcited holes at bismuth pair or cluster states located near the valence band maximum.

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