Abstract
This study examined the structure and perpendicular magnetization of FePt films grown on Pt/Fe/MgO(100) buffered Si(100) substrates by molecular beam epitaxy. The [Fe(0.17nm)/Pt(0.2nm)]N multilayers were prepared at room temperature to form a L10-FePt phase after vacuum annealing. Perpendicular magnetic anisotropy (PMA) was observed in the films after at least 15 repetitions (N = 15) of Fe/Pt deposition and annealing at 300°C for 1 hour. Careful structural analysis of the films was carried out by x-ray diffraction and high-resolution transmission electron microscopy. These results will assist in the development of the low temperature L10FePt deposition process, which will be essential for future extremely high density magnetic recording media.
Original language | English |
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Pages (from-to) | 144-146 |
Number of pages | 3 |
Journal | Journal of Magnetics |
Volume | 14 |
Issue number | 4 |
DOIs | |
State | Published - 2009 |
Keywords
- Epitaxial growth
- L1 FePt
- Molecular beam epitaxy
- Perpendicular magnetic anisotropy