TY - JOUR
T1 - On ageing concepts for repairable items from heterogeneous populations
AU - Cha, Ji Hwan
AU - Finkelstein, Maxim
N1 - Publisher Copyright:
© 1963-2012 IEEE.
PY - 2016/12
Y1 - 2016/12
N2 - Ageing concepts are very important in lifetime modeling and analysis. Monotonic failure rates are the simplest and most popular manifestations of aging properties of items in applications (IFR and DFR, accordingly). However, they are usually discussed for homogeneous populations, whereas heterogeneity can change dramatically the shape of the corresponding failure rate. In this paper, we suggest a new measure of ageing for items from heterogeneous populations based on the described process of information-based minimal repairs. We also show and illustrate, by several examples, that the conventional measure of aging based on the shape of the (population) failure rate is unrealistic in this case and can lead to wrong decisions, e.g., in burn-in procedures and optimal maintenance.
AB - Ageing concepts are very important in lifetime modeling and analysis. Monotonic failure rates are the simplest and most popular manifestations of aging properties of items in applications (IFR and DFR, accordingly). However, they are usually discussed for homogeneous populations, whereas heterogeneity can change dramatically the shape of the corresponding failure rate. In this paper, we suggest a new measure of ageing for items from heterogeneous populations based on the described process of information-based minimal repairs. We also show and illustrate, by several examples, that the conventional measure of aging based on the shape of the (population) failure rate is unrealistic in this case and can lead to wrong decisions, e.g., in burn-in procedures and optimal maintenance.
KW - Ageing
KW - information-based minimal repair
KW - population failure rate
KW - statistical minimal repair
UR - http://www.scopus.com/inward/record.url?scp=84975855291&partnerID=8YFLogxK
U2 - 10.1109/TR.2016.2570563
DO - 10.1109/TR.2016.2570563
M3 - Article
AN - SCOPUS:84975855291
SN - 0018-9529
VL - 65
SP - 1864
EP - 1870
JO - IEEE Transactions on Reliability
JF - IEEE Transactions on Reliability
IS - 4
M1 - 7494978
ER -