This paper reviews the NTIRE 2020 challenge on real image denoising with focus on the newly introduced dataset, the proposed methods and their results. The challenge is a new version of the previous NTIRE 2019 challenge on real image denoising that was based on the SIDD benchmark. This challenge is based on a newly collected validation and testing image datasets, and hence, named SIDD+. This challenge has two tracks for quantitatively evaluating image denoising performance in (1) the Bayer-pattern rawRGB and (2) the standard RGB (sRGB) color spaces. Each track ~250 registered participants. A total of 22 teams, proposing 24 methods, competed in the final phase of the challenge. The proposed methods by the participating teams represent the current state-of-the-art performance in image denoising targeting real noisy images. The newly collected SIDD+ datasets are publicly available at: https://bit.ly/siddplus-data.
|Title of host publication||Proceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020|
|Publisher||IEEE Computer Society|
|Number of pages||12|
|State||Published - Jun 2020|
|Event||2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States|
Duration: 14 Jun 2020 → 19 Jun 2020
|Name||IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops|
|Conference||2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020|
|Period||14/06/20 → 19/06/20|
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