Abstract
This paper reviews the NTIRE 2020 challenge on real image denoising with focus on the newly introduced dataset, the proposed methods and their results. The challenge is a new version of the previous NTIRE 2019 challenge on real image denoising that was based on the SIDD benchmark. This challenge is based on a newly collected validation and testing image datasets, and hence, named SIDD+. This challenge has two tracks for quantitatively evaluating image denoising performance in (1) the Bayer-pattern rawRGB and (2) the standard RGB (sRGB) color spaces. Each track ~250 registered participants. A total of 22 teams, proposing 24 methods, competed in the final phase of the challenge. The proposed methods by the participating teams represent the current state-of-the-art performance in image denoising targeting real noisy images. The newly collected SIDD+ datasets are publicly available at: https://bit.ly/siddplus-data.
Original language | English |
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Title of host publication | Proceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
Publisher | IEEE Computer Society |
Pages | 2077-2088 |
Number of pages | 12 |
ISBN (Electronic) | 9781728193601 |
DOIs | |
State | Published - Jun 2020 |
Event | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States Duration: 14 Jun 2020 → 19 Jun 2020 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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Volume | 2020-June |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 |
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Country/Territory | United States |
City | Virtual, Online |
Period | 14/06/20 → 19/06/20 |
Bibliographical note
Publisher Copyright:© 2020 IEEE.