Abstract
A brief state-of-the-art review in the field of cluster ion interaction with surface is presented. Ionised cluster beams are considered as a powerful and versatile tool for modification and processing of surfaces and near-surface layers as an alternative to ion implantation and ion assisted deposition. The main effects of cluster-surface collisions and possible applications of cluster ion beams are discussed.
Original language | English |
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Title of host publication | 2003 13th International Crimean Conference "Microwave and Telecommunication Technology", CriMiCo 2003 - Conference Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 523-525 |
Number of pages | 3 |
ISBN (Electronic) | 966796826X, 9789667968267 |
DOIs | |
State | Published - 2003 |
Event | 13th International Crimean Conference "Microwave and Telecommunication Technology", CriMiCo 2003 - Sevastopol, Crimea, Ukraine Duration: 8 Sep 2003 → 12 Sep 2003 |
Publication series
Name | 2003 13th International Crimean Conference "Microwave and Telecommunication Technology", CriMiCo 2003 - Conference Proceedings true |
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Conference
Conference | 13th International Crimean Conference "Microwave and Telecommunication Technology", CriMiCo 2003 |
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Country/Territory | Ukraine |
City | Sevastopol, Crimea |
Period | 8/09/03 → 12/09/03 |
Bibliographical note
Publisher Copyright:© 2003 IEEE.