Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling

J. Kim, Y. U. Lee, Boyoung Kang, J. H. Woo, E. Choi, E. S. Kim, M. Gwon, D. W. Kim, J. W. Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Physics

Material Science