@inproceedings{fc96f5b0ad804bd2ad1cfd73000ba30b,
title = "Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling",
abstract = "Nano-scaled metamaterials are fabricated by a focused ion beam milling under the fine control of process factors. The meta-resonances are studied in NTR regime and they show the polarization-angle dependence coming from their meta-structures.",
author = "J. Kim and Lee, \{Y. U.\} and Boyoung Kang and Woo, \{J. H.\} and E. Choi and Kim, \{E. S.\} and M. Gwon and Kim, \{D. W.\} and Wu, \{J. W.\}",
year = "2012",
doi = "10.1109/OECC.2012.6276788",
language = "English",
isbn = "9781467309776",
series = "Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012",
pages = "679--680",
booktitle = "Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012",
note = "2012 17th Opto-Electronics and Communications Conference, OECC 2012 ; Conference date: 02-07-2012 Through 06-07-2012",
}