Abstract
A nanoscale Schottky diode using Pt nanodisks on a Nb-doped SrTiO 3 (Nb:STO) single crystal was fabricated, and resistive switching (RS) was demonstrated with conductive atomic force microscopy at ultrahigh vacuum. Pt disks with diameters on the order of 10 nm were formed using colloidal self-assembled patterns of silica nanospheres, followed by evaporation of the Pt layers on the Nb:STO single crystal. Here we show that the reproducible bipolar RS behavior of the nanoscale Pt/Nb:STO Schottky junction was achieved by utilizing local current-voltage spectroscopy. The conductance images, obtained simultaneously with topographic images, show the homogeneous current distribution of selected triangular-shaped Pt nanodisks during repetitive resistive switching between the high-resistance state (HRS) and low-resistance state (LRS). The endurance characteristics of the Pt/Nb:STO junction exhibit reliable switching behavior. These results suggest that the rectifying and resistive Pt/Nb:STO junction can be scaled down to the 10 nm range and their position can be controlled.
Original language | English |
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Pages (from-to) | 11668-11672 |
Number of pages | 5 |
Journal | ACS Applied Materials and Interfaces |
Volume | 5 |
Issue number | 22 |
DOIs | |
State | Published - 27 Nov 2013 |
Keywords
- conductive atomic force microscopy
- Pt/Nb-doped SrTiO single crystal
- scaling down
- Schottky junction
- spatial mapping