Abstract
Stacked precursors of Cu-Zn-Sn-S were grown by radio frequency sputtering and annealed in a furnace with Se metals to form thin-film solar cell materials of Cu2ZnSn(S,Se)4 (CZTSSe). The samples have different absorber layer thickness of 1 to 2 μm and show conversion efficiencies up to 8.06%. Conductive atomic force microscopy and Kelvin probe force microscopy were used to explore the local electrical properties of the surface of CZTSSe thin films. The high-efficiency CZTSSe thin film exhibits significantly positive bending of surface potential around the grain boundaries. Dominant current paths along the grain boundaries are also observed. The surface electrical parameters of potential and current lead to potential solar cell applications using CZTSSe thin films, which may be an alternative choice of Cu(In,Ga)Se2.
Original language | English |
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Article number | 10 |
Pages (from-to) | 1-5 |
Number of pages | 5 |
Journal | Nanoscale Research Letters |
Volume | 9 |
Issue number | 1 |
DOIs | |
State | Published - 2014 |
Bibliographical note
Funding Information:This work was supported by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry, and Energy (No. 20123010010130).
Keywords
- Conductive atomic force microscopy
- Cu(in
- Kelvin probe force microscopy
- Kesterite