Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3

J. W. Hong; W. Jo; D. C. Kim; S. M. Cho; H. J. Nam; H. M. Lee; J. U. Bu

doi:10.1063/1.125271

Nanoscale investigation of domain retention in preferentially oriented PbZr_0.53Ti_0.47O₃ thin films on Pt and on LaNiO₃

J. W. Hong, W. Jo, D. C. Kim, S. M. Cho, H. J. Nam, H. M. Lee, J. U. Bu

Department of Physics

Research output: Contribution to journal › Article › peer-review

71 Scopus citations

Abstract

We report results on domain retention in preferentially oriented PbZr_0.53Ti_0.47O₃ (PZT) thin films on Pt and on LaNiO₃ (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased conductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on Pt. The time dependence of the remnant polarization is found to follow a stretched exponential decay.

Original language	English
Pages (from-to)	3183-3185
Number of pages	3
Journal	Applied Physics Letters
Volume	75
Issue number	20
DOIs	https://doi.org/10.1063/1.125271
State	Published - 15 Nov 1999

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title = "Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3",

abstract = "We report results on domain retention in preferentially oriented PbZr0.53Ti0.47O3 (PZT) thin films on Pt and on LaNiO3 (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased conductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on Pt. The time dependence of the remnant polarization is found to follow a stretched exponential decay.",

author = "Hong, {J. W.} and W. Jo and Kim, {D. C.} and Cho, {S. M.} and Nam, {H. J.} and Lee, {H. M.} and Bu, {J. U.}",

year = "1999",

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T1 - Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3

AU - Hong, J. W.

AU - Jo, W.

AU - Kim, D. C.

AU - Cho, S. M.

AU - Nam, H. J.

AU - Lee, H. M.

AU - Bu, J. U.

PY - 1999/11/15

Y1 - 1999/11/15

N2 - We report results on domain retention in preferentially oriented PbZr0.53Ti0.47O3 (PZT) thin films on Pt and on LaNiO3 (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased conductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on Pt. The time dependence of the remnant polarization is found to follow a stretched exponential decay.

AB - We report results on domain retention in preferentially oriented PbZr0.53Ti0.47O3 (PZT) thin films on Pt and on LaNiO3 (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased conductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on Pt. The time dependence of the remnant polarization is found to follow a stretched exponential decay.

UR - http://www.scopus.com/inward/record.url?scp=0001569886&partnerID=8YFLogxK

U2 - 10.1063/1.125271

DO - 10.1063/1.125271

M3 - Article

AN - SCOPUS:0001569886

SN - 0003-6951

VL - 75

SP - 3183

EP - 3185

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

ER -

Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3

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Nanoscale investigation of domain retention in preferentially oriented PbZr_0.53Ti_0.47O₃ thin films on Pt and on LaNiO₃