Mutation-based inter-class testing

Hoijin Yoon, Byoungju Choi, Jin Ok Jeon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Faults and failures due to interaction are the bane of testers. Since their subtlety makes them difficult to recognize and even more difficult to reveal by testing, it is important to specify interaction between classes systematically. In this paper, we propose mutation-based inter-class testing technique. Our inter-class testing technique consists of two procedures: test item identification procedure and test case selection procedure. For the test item identification procedure, we develop the Inheritance-Call graph (ICgraph) to identify the taxonomy of interaction of public methods between classes. For the test case selection procedure, we design a new criterion, state-based mutation testing criterion (SMTC), by applying mutation analysis to the state diagram representing class behavior. Mutation analysis is a well-known method for measuring test case adequacy which involves the mutation of a program by the introduction of small syntactic change in the program. The implementation of our proposed technique on a sample program shows that our technique leads to a set of test cases which detect errors in inter-class relation.

Original languageEnglish
Title of host publicationProceedings - 1998 Asia Pacific Software Engineering Conference, APSEC 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages174-181
Number of pages8
ISBN (Electronic)0818691832, 9780818691836
DOIs
StatePublished - 1998
Event1998 Asia Pacific Software Engineering Conference, APSEC 1998 - Taipei, Taiwan, Province of China
Duration: 2 Dec 19984 Dec 1998

Publication series

NameProceedings - 1998 Asia Pacific Software Engineering Conference, APSEC 1998
Volume1998-December

Conference

Conference1998 Asia Pacific Software Engineering Conference, APSEC 1998
Country/TerritoryTaiwan, Province of China
CityTaipei
Period2/12/984/12/98

Bibliographical note

Publisher Copyright:
© 1998 IEEE.

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