Morphology and Luminescence of Poly (p -Phenylene Vinylene) Films Prepared by Chemical Vapor Deposition

Guolun Zhong; Kyungkon Kim; Dongjune Ahn; Taeyoung Kim; Jung Il Jin

doi:10.1080/713738534

Morphology and Luminescence of Poly (p -Phenylene Vinylene) Films Prepared by Chemical Vapor Deposition

Guolun Zhong, Kyungkon Kim, Dongjune Ahn, Taeyoung Kim, Jung Il Jin

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

Abstract

The films of poly(p -phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α, α ′-dichloro- p -xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photo-luminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

Original language	English
Pages (from-to)	169-172
Number of pages	4
Journal	Molecular Crystals and Liquid Crystals
Volume	377
Issue number	1
DOIs	https://doi.org/10.1080/713738534
State	Published - 2002

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© 2002, Copyright Taylor & Francis Group, LLC.

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abstract = "The films of poly(p -phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α, α ′-dichloro- p -xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photo-luminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.",

author = "Guolun Zhong and Kyungkon Kim and Dongjune Ahn and Taeyoung Kim and Jin, {Jung Il}",

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AU - Zhong, Guolun

AU - Kim, Kyungkon

AU - Ahn, Dongjune

AU - Kim, Taeyoung

AU - Jin, Jung Il

PY - 2002

Y1 - 2002

N2 - The films of poly(p -phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α, α ′-dichloro- p -xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photo-luminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

AB - The films of poly(p -phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α, α ′-dichloro- p -xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photo-luminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

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JF - Molecular Crystals and Liquid Crystals

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ER -

Morphology and Luminescence of Poly (p -Phenylene Vinylene) Films Prepared by Chemical Vapor Deposition

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