Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition

Guolun Zhong, Kyungkon Kim, Dongjune Ahn, Taeyoung Kim, Jung Il Jin

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


The films of poly(p-phenylene vinylene) (PPV) were prepared by chemical vapor deposition (CVD) of α,α′-dichloro-p-xylene on the surface of crystalline silicon (001) wafer. Atomic force microscopy (AFM) and reflective IR were used for measuring the topographic images and the orientations of PPV chains, respectively. Photoluminescent (PL) property of the PPV films indicates that the details of PL spectrum are dependent on the thickness of the films deposited on the wafer surface. The UV-vis spectrum was also measured for the PPV films deposited on the amorphous quartz substrate.

Original languageEnglish
Pages (from-to)169-172
Number of pages4
JournalMolecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
StatePublished - 2002
EventProceedings of the Korea-Japan Joint Forum on Organic Materials for Electronics and Photonics (KJF2001) - Seoul, Korea, Republic of
Duration: 25 Sep 200127 Sep 2001


  • Atomic force microscopy
  • Chemical vapor deposition
  • PPV
  • Photoluminescence
  • Reflective IR
  • Silicon wafer


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