Modeling of alpha-particle-induced soft error rate in DRAM

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Alpha-particle-induced soft error in 256M DRAM was numerically investigated. A unified model for alpha-particle-induced charge collection and a soft-error-rate simulator (SERS) was developed. We investigated the soft error rate of 256M DRAM and identified the bit-bar mode as one of dominant modes for soft error. In addition, for the first time, it was found that trench-oxide depth has a significant influence on soft error rate, and it should be determined by the tradeoff between soft error rate and cell-to-cell isolation characteristics.

Original languageEnglish
Pages (from-to)1850-1857
Number of pages8
JournalIEEE Transactions on Electron Devices
Issue number9
StatePublished - 1999


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