Microstructural properties of phase-change Ge 2Sb 2Te 5 nanoparticles grown by pulsed-laser ablation

A. R. Jeong; H. R. Yoon; Y. J. Oh; T. Y. Kim; W. Jo; M. Kim

doi:10.1166/jnn.2009.C050

Microstructural properties of phase-change Ge ₂Sb ₂Te ₅ nanoparticles grown by pulsed-laser ablation

A. R. Jeong, H. R. Yoon, Y. J. Oh, T. Y. Kim, W. Jo, M. Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We have introduced in-situ growth of Ge ₂Sb ₂Te ₅ (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directly on PtIlr-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge ₂Sb ₂Te ₅ phase which has a lattice constant with '-6 A like bulk value of face-centered cubic and hexagonal structure.

Original language	English
Pages (from-to)	901-904
Number of pages	4
Journal	Journal of Nanoscience and Nanotechnology
Volume	9
Issue number	2
DOIs	https://doi.org/10.1166/jnn.2009.C050
State	Published - Feb 2009

Keywords

Ge Sb Te (GST) nanoparticle
Microstructure
Transmission electron microscopy (TEM)

Access to Document

10.1166/jnn.2009.C050

Cite this

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title = "Microstructural properties of phase-change Ge 2Sb 2Te 5 nanoparticles grown by pulsed-laser ablation",

abstract = "We have introduced in-situ growth of Ge 2Sb 2Te 5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directly on PtIlr-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge 2Sb 2Te 5 phase which has a lattice constant with '-6 A like bulk value of face-centered cubic and hexagonal structure.",

keywords = "Ge Sb Te (GST) nanoparticle, Microstructure, Transmission electron microscopy (TEM)",

author = "Jeong, {A. R.} and Yoon, {H. R.} and Oh, {Y. J.} and Kim, {T. Y.} and W. Jo and M. Kim",

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language = "English",

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AU - Jeong, A. R.

AU - Yoon, H. R.

AU - Oh, Y. J.

AU - Kim, T. Y.

AU - Jo, W.

AU - Kim, M.

PY - 2009/2

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AB - We have introduced in-situ growth of Ge 2Sb 2Te 5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directly on PtIlr-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge 2Sb 2Te 5 phase which has a lattice constant with '-6 A like bulk value of face-centered cubic and hexagonal structure.

KW - Ge Sb Te (GST) nanoparticle

KW - Microstructure

KW - Transmission electron microscopy (TEM)

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