Microstructural origin of 1/f noise in high Tc bicrystal SQUID magnetometers

Y. Huang; K. L. Merkle; L. P. Lee; M. Teepe; K. Char

doi:10.1063/1.120487

Microstructural origin of 1/f noise in high T_c bicrystal SQUID magnetometers

Y. Huang, K. L. Merkle, L. P. Lee, M. Teepe, K. Char

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The origin of noise in YBa₂Cu₃O_7-x (YBCO) bicrystal SQUID magnetometers on SrTiO₃ substrates is investigated by comparing the microstructure of actual low-noise and high-noise devices. The most obvious difference in the microstructure is the presence of a-axis oriented particles in the high-noise devices, whereas the low-noise devices consist exclusively of c-axis oriented YBCO films. The growth of the a-axis particles in the YBCO films induces many defects, including amorphous regions, distortion in c-axis lattice planes and extra a-c interfaces. The quality of the junction boundary is also degraded by the a-axis particles. The existence of these defects are expected to affect the superconducting current and the motion of the magnetic flux in the films and hence generate extra noise in the devices.

Original language	English
Pages (from-to)	3703-3705
Number of pages	3
Journal	Applied Physics Letters
Volume	71
Issue number	25
DOIs	https://doi.org/10.1063/1.120487
State	Published - 22 Dec 1997

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title = "Microstructural origin of 1/f noise in high Tc bicrystal SQUID magnetometers",

abstract = "The origin of noise in YBa2Cu3O7-x (YBCO) bicrystal SQUID magnetometers on SrTiO3 substrates is investigated by comparing the microstructure of actual low-noise and high-noise devices. The most obvious difference in the microstructure is the presence of a-axis oriented particles in the high-noise devices, whereas the low-noise devices consist exclusively of c-axis oriented YBCO films. The growth of the a-axis particles in the YBCO films induces many defects, including amorphous regions, distortion in c-axis lattice planes and extra a-c interfaces. The quality of the junction boundary is also degraded by the a-axis particles. The existence of these defects are expected to affect the superconducting current and the motion of the magnetic flux in the films and hence generate extra noise in the devices.",

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T1 - Microstructural origin of 1/f noise in high Tc bicrystal SQUID magnetometers

AU - Huang, Y.

AU - Merkle, K. L.

AU - Lee, L. P.

AU - Teepe, M.

AU - Char, K.

PY - 1997/12/22

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N2 - The origin of noise in YBa2Cu3O7-x (YBCO) bicrystal SQUID magnetometers on SrTiO3 substrates is investigated by comparing the microstructure of actual low-noise and high-noise devices. The most obvious difference in the microstructure is the presence of a-axis oriented particles in the high-noise devices, whereas the low-noise devices consist exclusively of c-axis oriented YBCO films. The growth of the a-axis particles in the YBCO films induces many defects, including amorphous regions, distortion in c-axis lattice planes and extra a-c interfaces. The quality of the junction boundary is also degraded by the a-axis particles. The existence of these defects are expected to affect the superconducting current and the motion of the magnetic flux in the films and hence generate extra noise in the devices.

AB - The origin of noise in YBa2Cu3O7-x (YBCO) bicrystal SQUID magnetometers on SrTiO3 substrates is investigated by comparing the microstructure of actual low-noise and high-noise devices. The most obvious difference in the microstructure is the presence of a-axis oriented particles in the high-noise devices, whereas the low-noise devices consist exclusively of c-axis oriented YBCO films. The growth of the a-axis particles in the YBCO films induces many defects, including amorphous regions, distortion in c-axis lattice planes and extra a-c interfaces. The quality of the junction boundary is also degraded by the a-axis particles. The existence of these defects are expected to affect the superconducting current and the motion of the magnetic flux in the films and hence generate extra noise in the devices.

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Microstructural origin of 1/f noise in high Tc bicrystal SQUID magnetometers

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Microstructural origin of 1/f noise in high T_c bicrystal SQUID magnetometers