Measuring far-ultraviolet whispering gallery modes with high energy electrons

J. K. Hyun; M. Couillard; P. Rajendran; C. M. Liddell; D. A. Muller

doi:10.1063/1.3046731

Measuring far-ultraviolet whispering gallery modes with high energy electrons

J. K. Hyun, M. Couillard, P. Rajendran, C. M. Liddell, D. A. Muller

Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO₂ nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

Original language	English
Article number	243106
Journal	Applied Physics Letters
Volume	93
Issue number	24
DOIs	https://doi.org/10.1063/1.3046731
State	Published - 2008

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title = "Measuring far-ultraviolet whispering gallery modes with high energy electrons",

abstract = "Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.",

author = "Hyun, {J. K.} and M. Couillard and P. Rajendran and Liddell, {C. M.} and Muller, {D. A.}",

note = "Funding Information: This project has been supported by NSF DMR-0405195, EEC-0117770, and 0646547 and the Semiconductor Research Corporation and facilities MRSEC DMR-0520404 and DMR-0547976 funding. A. Yurtsever is thanked for useful discussions. ",

year = "2008",

doi = "10.1063/1.3046731",

language = "English",

volume = "93",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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T1 - Measuring far-ultraviolet whispering gallery modes with high energy electrons

AU - Hyun, J. K.

AU - Couillard, M.

AU - Rajendran, P.

AU - Liddell, C. M.

AU - Muller, D. A.

N1 - Funding Information: This project has been supported by NSF DMR-0405195, EEC-0117770, and 0646547 and the Semiconductor Research Corporation and facilities MRSEC DMR-0520404 and DMR-0547976 funding. A. Yurtsever is thanked for useful discussions.

PY - 2008

Y1 - 2008

N2 - Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

AB - Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

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DO - 10.1063/1.3046731

M3 - Article

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VL - 93

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

M1 - 243106

ER -

Measuring far-ultraviolet whispering gallery modes with high energy electrons

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