Measuring far-ultraviolet whispering gallery modes with high energy electrons

J. K. Hyun; M. Couillard; P. Rajendran; C. M. Liddell; D. A. Muller

doi:10.1063/1.3046731

Measuring far-ultraviolet whispering gallery modes with high energy electrons

J. K. Hyun, M. Couillard, P. Rajendran, C. M. Liddell, D. A. Muller

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO₂ nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

Original language	English
Article number	243106
Journal	Applied Physics Letters
Volume	93
Issue number	24
DOIs	https://doi.org/10.1063/1.3046731
State	Published - 2008

Bibliographical note

Funding Information:
This project has been supported by NSF DMR-0405195, EEC-0117770, and 0646547 and the Semiconductor Research Corporation and facilities MRSEC DMR-0520404 and DMR-0547976 funding. A. Yurtsever is thanked for useful discussions.

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title = "Measuring far-ultraviolet whispering gallery modes with high energy electrons",

abstract = "Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.",

author = "Hyun, {J. K.} and M. Couillard and P. Rajendran and Liddell, {C. M.} and Muller, {D. A.}",

note = "Funding Information: This project has been supported by NSF DMR-0405195, EEC-0117770, and 0646547 and the Semiconductor Research Corporation and facilities MRSEC DMR-0520404 and DMR-0547976 funding. A. Yurtsever is thanked for useful discussions. ",

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AU - Hyun, J. K.

AU - Couillard, M.

AU - Rajendran, P.

AU - Liddell, C. M.

AU - Muller, D. A.

N1 - Funding Information: This project has been supported by NSF DMR-0405195, EEC-0117770, and 0646547 and the Semiconductor Research Corporation and facilities MRSEC DMR-0520404 and DMR-0547976 funding. A. Yurtsever is thanked for useful discussions.

PY - 2008

Y1 - 2008

N2 - Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

AB - Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers.

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Measuring far-ultraviolet whispering gallery modes with high energy electrons

Abstract

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