Measurement of the linear eletro-optic, effect by reflection method in Mach-Zehnder interferometer

M. J. Shin, H. K. Cho, S. H. Han, J. W. Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A Mach-Zehnder interferometer(MZI) is adopted to measure the linear electro- optic(EO) coefficient of the poled polymer film. KO effect is measured as a function of the optical bias, the modulation voltage, and t he direct ion of polarization.

Original languageEnglish
Title of host publication17th Congress of the International Commission for Optics
Subtitle of host publicationOptics for Science and New Technology
Pages842-843
Number of pages2
EditionPART 2
StatePublished - 1996
Event17th Congress of the International Commission for Optics: Optics for Science and New Technology, ICO 1996 - Taejon, Korea, Republic of
Duration: 19 Aug 199623 Aug 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
NumberPART 2
Volume2778
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference17th Congress of the International Commission for Optics: Optics for Science and New Technology, ICO 1996
Country/TerritoryKorea, Republic of
CityTaejon
Period19/08/9623/08/96

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