Material removal dynamics after femtosecond laser pulse excitation of dielectrics

A. Rosenfeld; D. Ashkenasi; H. Varel; M. Waehmer; E. E.B. Campbell

doi:10.1109/cleo.1998.676585

Material removal dynamics after femtosecond laser pulse excitation of dielectrics

A. Rosenfeld, D. Ashkenasi, H. Varel, M. Waehmer, E. E.B. Campbell

Department of Physics

Research output: Contribution to conference › Paper › peer-review

4 Scopus citations

Abstract

While electrons remain in or closely below the conduction band for over 50 ps in MgO and sapphire, they are trapped deep into the bandgap after only 150 fs in amorphous and crystalline quartz. To determine the onset of the ablation from the surface after intensive laser excitation, the time development of changes in the scattered light from the surface was examined. Experiments were carried out under vacuum conditions. The signal of the scattered light from the probe pulse was detected by means of a long-distance microscope tilted under an angle of 30° and a photomultiplier. The scattered signal for a given delay time between pump and probe pulse was averaged for 10 different single-shot measurements.

Original language	English
Pages	525-526
Number of pages	2
DOIs	https://doi.org/10.1109/cleo.1998.676585
State	Published - 1998
Event	Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO - San Francisco, CA, USA Duration: 3 May 1998 → 8 May 1998

Conference

Conference	Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO
City	San Francisco, CA, USA
Period	3/05/98 → 8/05/98

Access to Document

10.1109/cleo.1998.676585

Cite this

@conference{00372cbd4c1f4664aff4f4a7dbacddcd,

title = "Material removal dynamics after femtosecond laser pulse excitation of dielectrics",

abstract = "While electrons remain in or closely below the conduction band for over 50 ps in MgO and sapphire, they are trapped deep into the bandgap after only 150 fs in amorphous and crystalline quartz. To determine the onset of the ablation from the surface after intensive laser excitation, the time development of changes in the scattered light from the surface was examined. Experiments were carried out under vacuum conditions. The signal of the scattered light from the probe pulse was detected by means of a long-distance microscope tilted under an angle of 30° and a photomultiplier. The scattered signal for a given delay time between pump and probe pulse was averaged for 10 different single-shot measurements.",

author = "A. Rosenfeld and D. Ashkenasi and H. Varel and M. Waehmer and Campbell, {E. E.B.}",

year = "1998",

doi = "10.1109/cleo.1998.676585",

language = "English",

pages = "525--526",

note = "Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO ; Conference date: 03-05-1998 Through 08-05-1998",

}

TY - CONF

T1 - Material removal dynamics after femtosecond laser pulse excitation of dielectrics

AU - Rosenfeld, A.

AU - Ashkenasi, D.

AU - Varel, H.

AU - Waehmer, M.

AU - Campbell, E. E.B.

PY - 1998

Y1 - 1998

N2 - While electrons remain in or closely below the conduction band for over 50 ps in MgO and sapphire, they are trapped deep into the bandgap after only 150 fs in amorphous and crystalline quartz. To determine the onset of the ablation from the surface after intensive laser excitation, the time development of changes in the scattered light from the surface was examined. Experiments were carried out under vacuum conditions. The signal of the scattered light from the probe pulse was detected by means of a long-distance microscope tilted under an angle of 30° and a photomultiplier. The scattered signal for a given delay time between pump and probe pulse was averaged for 10 different single-shot measurements.

AB - While electrons remain in or closely below the conduction band for over 50 ps in MgO and sapphire, they are trapped deep into the bandgap after only 150 fs in amorphous and crystalline quartz. To determine the onset of the ablation from the surface after intensive laser excitation, the time development of changes in the scattered light from the surface was examined. Experiments were carried out under vacuum conditions. The signal of the scattered light from the probe pulse was detected by means of a long-distance microscope tilted under an angle of 30° and a photomultiplier. The scattered signal for a given delay time between pump and probe pulse was averaged for 10 different single-shot measurements.

UR - http://www.scopus.com/inward/record.url?scp=0031627608&partnerID=8YFLogxK

U2 - 10.1109/cleo.1998.676585

DO - 10.1109/cleo.1998.676585

M3 - Paper

AN - SCOPUS:0031627608

SP - 525

EP - 526

T2 - Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO

Y2 - 3 May 1998 through 8 May 1998

ER -

Material removal dynamics after femtosecond laser pulse excitation of dielectrics

Abstract

Conference

Access to Document

Fingerprint

Cite this