Machine Learning-Assisted Identification of Single-Layer Graphene via Color Variation Analysis

Eunseo Yang, Miri Seo, Hanee Rhee, Yugyeong Je, Hyunjeong Jeong, Sang Wook Lee

Research output: Contribution to journalArticlepeer-review

Abstract

Techniques such as using an optical microscope and Raman spectroscopy are common methods for detecting single-layer graphene. Instead of relying on these laborious and expensive methods, we suggest a novel approach inspired by skilled human researchers who can detect single-layer graphene by simply observing color differences between graphene flakes and the background substrate in optical microscope images. This approach implemented the human cognitive process by emulating it through our data extraction process and machine learning algorithm. We obtained approximately 300,000 pixel-level color difference data from 140 graphene flakes from 45 optical microscope images. We utilized the average and standard deviation of the color difference data for each flake for machine learning. As a result, we achieved F1-Scores of over 0.90 and 0.92 in identifying 60 and 50 flakes from green and pink substrate images, respectively. Our machine learning-assisted computing system offers a cost-effective and universal solution for detecting the number of graphene layers in diverse experimental environments, saving both time and resources. We anticipate that this approach can be extended to classify the properties of other 2D materials.

Original languageEnglish
Article number183
JournalNanomaterials
Volume14
Issue number2
DOIs
StatePublished - Jan 2024

Bibliographical note

Publisher Copyright:
© 2024 by the authors.

Keywords

  • graphene
  • machine learning
  • support vector machine

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