Mach-Zehnder interferometry measurement of the elctro-optic effect in a poled polymer film

M. J. Shin; H. R. Cho; S. H. Han; J. W. Wu

doi:10.1080/10587259808044460

Mach-Zehnder interferometry measurement of the elctro-optic effect in a poled polymer film

M. J. Shin, H. R. Cho, S. H. Han, J. W. Wu

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

Two different configurations, reflection and transmission, of Mach-Zehnder interferometer(MZI) are introduced for the measurement of the electro-optic coefficients in a poled polymer thin film. The MZI measurement of the electro-optic coefficients has an advantage of permitting the determination of the electro-optic tensor coefficients, r₁₃ and r₃₃, independently, when compared with the single-beam polarization interferometer. In the reflection configuration of two beam interferometric measurement, a proper consideration of the optical path change, due to the reflection angle change, is found to be critical in determining the absolute value of the electro-optic coefficients, while the transmission configuration allows the independent determination of the electro-optic coefficients in the direction of the ordinary and the extraordinary optic axes.

Original language	English
Pages (from-to)	61-66
Number of pages	6
Journal	Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
Volume	316
DOIs	https://doi.org/10.1080/10587259808044460
State	Published - 1998
Event	Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) - St.Paul, MN, USA Duration: 18 May 1998 → 21 May 1998

Bibliographical note

Funding Information:
This work is supported by the Korea Science and Engineering Foundation (Grant No. 95-0300-06-01-3) and by the Basic Science Research Institute Program, Ministry of Education, Republic of Korea (Grant No. BSRI-97-2428).

Keywords

Electro-Optic Coefficient
Mach-Zehnder Interferometry
Refractive Index

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10.1080/10587259808044460

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@article{168eb70ddd8144d3a25b3ac9238dd0af,

title = "Mach-Zehnder interferometry measurement of the elctro-optic effect in a poled polymer film",

abstract = "Two different configurations, reflection and transmission, of Mach-Zehnder interferometer(MZI) are introduced for the measurement of the electro-optic coefficients in a poled polymer thin film. The MZI measurement of the electro-optic coefficients has an advantage of permitting the determination of the electro-optic tensor coefficients, r13 and r33, independently, when compared with the single-beam polarization interferometer. In the reflection configuration of two beam interferometric measurement, a proper consideration of the optical path change, due to the reflection angle change, is found to be critical in determining the absolute value of the electro-optic coefficients, while the transmission configuration allows the independent determination of the electro-optic coefficients in the direction of the ordinary and the extraordinary optic axes.",

keywords = "Electro-Optic Coefficient, Mach-Zehnder Interferometry, Refractive Index",

author = "Shin, {M. J.} and Cho, {H. R.} and Han, {S. H.} and Wu, {J. W.}",

note = "Funding Information: This work is supported by the Korea Science and Engineering Foundation (Grant No. 95-0300-06-01-3) and by the Basic Science Research Institute Program, Ministry of Education, Republic of Korea (Grant No. BSRI-97-2428).; Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) ; Conference date: 18-05-1998 Through 21-05-1998",

year = "1998",

doi = "10.1080/10587259808044460",

language = "English",

volume = "316",

pages = "61--66",

journal = "Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals",

issn = "1058-725X",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - Mach-Zehnder interferometry measurement of the elctro-optic effect in a poled polymer film

AU - Shin, M. J.

AU - Cho, H. R.

AU - Han, S. H.

AU - Wu, J. W.

N1 - Funding Information: This work is supported by the Korea Science and Engineering Foundation (Grant No. 95-0300-06-01-3) and by the Basic Science Research Institute Program, Ministry of Education, Republic of Korea (Grant No. BSRI-97-2428).

PY - 1998

Y1 - 1998

N2 - Two different configurations, reflection and transmission, of Mach-Zehnder interferometer(MZI) are introduced for the measurement of the electro-optic coefficients in a poled polymer thin film. The MZI measurement of the electro-optic coefficients has an advantage of permitting the determination of the electro-optic tensor coefficients, r13 and r33, independently, when compared with the single-beam polarization interferometer. In the reflection configuration of two beam interferometric measurement, a proper consideration of the optical path change, due to the reflection angle change, is found to be critical in determining the absolute value of the electro-optic coefficients, while the transmission configuration allows the independent determination of the electro-optic coefficients in the direction of the ordinary and the extraordinary optic axes.

AB - Two different configurations, reflection and transmission, of Mach-Zehnder interferometer(MZI) are introduced for the measurement of the electro-optic coefficients in a poled polymer thin film. The MZI measurement of the electro-optic coefficients has an advantage of permitting the determination of the electro-optic tensor coefficients, r13 and r33, independently, when compared with the single-beam polarization interferometer. In the reflection configuration of two beam interferometric measurement, a proper consideration of the optical path change, due to the reflection angle change, is found to be critical in determining the absolute value of the electro-optic coefficients, while the transmission configuration allows the independent determination of the electro-optic coefficients in the direction of the ordinary and the extraordinary optic axes.

KW - Electro-Optic Coefficient

KW - Mach-Zehnder Interferometry

KW - Refractive Index

UR - http://www.scopus.com/inward/record.url?scp=0032056868&partnerID=8YFLogxK

U2 - 10.1080/10587259808044460

DO - 10.1080/10587259808044460

M3 - Conference article

AN - SCOPUS:0032056868

SN - 1058-725X

VL - 316

SP - 61

EP - 66

JO - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

JF - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

T2 - Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2)

Y2 - 18 May 1998 through 21 May 1998

ER -

Mach-Zehnder interferometry measurement of the elctro-optic effect in a poled polymer film

Abstract

Bibliographical note

Keywords

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