Local retention behaviors of epitaxial and polycrystalline Pb Mg13 Nb23 O3 -PbTi O3 thin films by scanning force microscopy

J. H. Lee, M. R. Choi, Y. J. Oh, W. Jo

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Abstract

The authors report the results of retention in epitaxial and polycrystalline Pb Mg13 Nb23 O3 -PbTi O3 (PMN-PT) thin films on SrRu O3 (SRO) and Pt. The SRO electrodes were deposited by pulsed laser deposition and the PMN-PT thin films were coated by a sol-gel method. Local poling behaviors of the PMN-PT domains were investigated as a function of time in both single-poled and reverse-poled regions by scanning force microscopy. An extended exponential decay is observed in the PMN-PT/SRO heterostructures while a fluctuated relaxation is shown in the PMN-PT/Pt films, suggesting that crystal orientation and grain growth is critical to understand retention of relaxor ferroelectrics.

Original languageEnglish
Article number072906
JournalApplied Physics Letters
Volume91
Issue number7
DOIs
StatePublished - 2007

Bibliographical note

Funding Information:
This research was supported by a grant (Code No. 07K1501-02520) from the Center for Nanostructured Materials Technology under the 21st Century Frontier R&D Programs of the Ministry of Science and Technology, Korea. One of the authors (J.H.L.) acknowledges support from the Seoul Science Fellowship program.

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