Fingerprint
Dive into the research topics of 'Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7-x coated conductors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7-x coated conductors
W. Jo, R. H. Hammond, M. R. Beasley
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations