Leakage current behaviors of epitaxial and preferentially oriented Bi₄Ti₃O₁₂ thin films grown on La_0.5Sr_0.5CoO₃ bottom electrodes

Material Science

• Film 100%
• Thin Films 100%
• Pulsed Laser Deposition 50%
• Scanning Electron Microscopy 50%
• Heterojunction 50%
• Aluminum Oxide 50%
• X Ray Diffraction Analysis 50%

Physics

• Thin Films 100%
• X-Ray Diffraction 50%
• Scanning Electron Microscopy 50%
• Space Charge 50%
• Oxygen Ion 50%
• Pulsed Laser Deposition 50%