KNN Local Attention for Image Restoration

Hunsang Lee, Hyesong Choi, Kwanghoon Sohn, Dongbo Min

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

33 Scopus citations

Abstract

Recent works attempt to integrate the non-local operation with CNNs or Transformer, achieving remarkable performance in image restoration tasks. The global similarity, however, has the problems of the lack of locality and the high computational complexity that is quadratic to an input resolution. The local attention mechanism alleviates these issues by introducing the inductive bias of the locality with convolution-like operators. However, by focusing only on adjacent positions, the local attention suffers from an insufficient receptive field for image restoration. In this paper, we propose a new attention mechanism for image restoration, called k-NN Image Transformer (KiT), that rectifies the above mentioned limitations. Specifically, the KiT groups k-nearest neighbor patches with locality sensitive hashing (LSH), and the grouped patches are aggregated into each query patch by performing a pair-wise local attention. In this way, the pair-wise operation establishes nonlocal connectivity while maintaining the desired properties of the local attention, i.e., inductive bias of locality and linear complexity to input resolution. The proposed method outperforms state-of-the-art restoration approaches on image denoising, deblurring and deraining benchmarks. The code will be available soon.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages2129-2139
Number of pages11
ISBN (Electronic)9781665469463
DOIs
StatePublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • Low-level vision
  • Machine learning

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