Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se 2 and Cu 2ZnSnSe 4 thin-films grown by co-evaporation methods

Ah Reum Jeong; Ran Hee Shin; William Jo; Jihye Gwak; Se Jin Ahn; Jae Ho Yun; Kyunghoon Yoon

doi:10.1109/PVSC.2011.6185975

Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se ₂ and Cu ₂ZnSnSe ₄ thin-films grown by co-evaporation methods

Ah Reum Jeong, Ran Hee Shin, William Jo, Jihye Gwak, Se Jin Ahn, Jae Ho Yun, Kyunghoon Yoon

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Cu ₂ZnSnSe ₄ (CZTSe) thin-films is a promising candidate for absorber layer as an alternative to Cu(In, Ga)Se ₂ (CIGS) solar cells. However, they have been recorded lower efficiency than that of CIGS until now. In CIGS, local electrical property is an important issue for high efficiency such as Na interstitial in the grain boundaries (GBs). Therefore, difference between CIGS with CZTSe in local electrical property can be one of the clues for explaining lower efficiency of CZTSe thin-film solar cells than CIGS. We studied local surface potential using Kelvin probe force microscopy (KPFM) around GBs. The results reveal difference of electron-hole transport behavior on both thin-films at GBs. Eventually, we can understand relation between solar cell efficiency and local electrical property.

Original language	English
Title of host publication	Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Pages	387-389
Number of pages	3
DOIs	https://doi.org/10.1109/PVSC.2011.6185975
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States Duration: 19 Jun 2011 → 24 Jun 2011

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/Territory	United States
City	Seattle, WA
Period	19/06/11 → 24/06/11

Access to Document

10.1109/PVSC.2011.6185975

Cite this

Jeong, A. R., Shin, R. H., Jo, W., Gwak, J., Ahn, S. J., Yun, J. H., & Yoon, K. (2011). Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se ₂ and Cu ₂ZnSnSe ₄ thin-films grown by co-evaporation methods. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011 (pp. 387-389). Article 6185975 (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2011.6185975

@inproceedings{9e507fd257984c5e996be19c34e83f87,

title = "Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se 2 and Cu 2ZnSnSe 4 thin-films grown by co-evaporation methods",

abstract = "Cu 2ZnSnSe 4 (CZTSe) thin-films is a promising candidate for absorber layer as an alternative to Cu(In, Ga)Se 2 (CIGS) solar cells. However, they have been recorded lower efficiency than that of CIGS until now. In CIGS, local electrical property is an important issue for high efficiency such as Na interstitial in the grain boundaries (GBs). Therefore, difference between CIGS with CZTSe in local electrical property can be one of the clues for explaining lower efficiency of CZTSe thin-film solar cells than CIGS. We studied local surface potential using Kelvin probe force microscopy (KPFM) around GBs. The results reveal difference of electron-hole transport behavior on both thin-films at GBs. Eventually, we can understand relation between solar cell efficiency and local electrical property.",

author = "Jeong, {Ah Reum} and Shin, {Ran Hee} and William Jo and Jihye Gwak and Ahn, {Se Jin} and Yun, {Jae Ho} and Kyunghoon Yoon",

year = "2011",

doi = "10.1109/PVSC.2011.6185975",

language = "English",

isbn = "9781424499656",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

pages = "387--389",

booktitle = "Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011",

note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

}

Jeong, AR, Shin, RH, Jo, W, Gwak, J, Ahn, SJ, Yun, JH & Yoon, K 2011, Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se ₂ and Cu ₂ZnSnSe ₄ thin-films grown by co-evaporation methods. in Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011., 6185975, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 387-389, 37th IEEE Photovoltaic Specialists Conference, PVSC 2011, Seattle, WA, United States, 19/06/11. https://doi.org/10.1109/PVSC.2011.6185975

Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se ₂ and Cu ₂ZnSnSe ₄ thin-films grown by co-evaporation methods. / Jeong, Ah Reum; Shin, Ran Hee; Jo, William et al.
Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 387-389 6185975 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Jeong, Ah Reum

AU - Shin, Ran Hee

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AU - Ahn, Se Jin

AU - Yun, Jae Ho

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AB - Cu 2ZnSnSe 4 (CZTSe) thin-films is a promising candidate for absorber layer as an alternative to Cu(In, Ga)Se 2 (CIGS) solar cells. However, they have been recorded lower efficiency than that of CIGS until now. In CIGS, local electrical property is an important issue for high efficiency such as Na interstitial in the grain boundaries (GBs). Therefore, difference between CIGS with CZTSe in local electrical property can be one of the clues for explaining lower efficiency of CZTSe thin-film solar cells than CIGS. We studied local surface potential using Kelvin probe force microscopy (KPFM) around GBs. The results reveal difference of electron-hole transport behavior on both thin-films at GBs. Eventually, we can understand relation between solar cell efficiency and local electrical property.

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Jeong AR, Shin RH, Jo W, Gwak J, Ahn SJ, Yun JH et al. Kelvin probe microscopic studies on grain boundaries of Cu(In, Ga)Se ₂ and Cu ₂ZnSnSe ₄ thin-films grown by co-evaporation methods. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 387-389. 6185975. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2011.6185975