Investigation on resistive memory switching mechanism of NiO

D. C. Kim, S. Seo, D. S. Suh, R. Jung, C. W. Lee, J. K. Shin, I. K. Yoo, I. G. Baek, H. J. Kim, E. K. Yim, C. W. Lee, S. O. Park, H. S. Kim, U. I. Chung, J. T. Moon, B. I. Ryu, J. S. Kim, B. H. Park

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