Abstract
Radiation detectors are currently fabricated by a screen-print method at room temperature. However, this method has many disadvantages in terms of thickness control and electron trapping. We fabricated polycrystalline PbI 2 films by a new sedimentation method and compared the results with those obtained by the existing screen-print (SP) method. We investigated the electrical and structural properties of the films. We fabricated 2 × 2 cm2 sample films with a thickness of about 200 mm. A field emission scanning electron microscopy (FE-SEM) analysis showed that these films were of higher density than those fabricated by a conventional SP method. We also measured the photosensitivity and dark current of the films. The photosensitivity of the films fabricated by the new sedimentation method was 4.8 pC/(mRdot;mm2), and the dark current was 2.2 pA/mm2 at 1.0 V/mm. The linearity of the film ranged from 3 to 12 mAs, which is promising for diagnostic radiography.
Original language | English |
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Pages (from-to) | 418011-418014 |
Number of pages | 4 |
Journal | Japanese Journal of Applied Physics |
Volume | 49 |
Issue number | 4 PART 1 |
DOIs | |
State | Published - Apr 2010 |