Investigation and optimization of double-gate MPI 1T DRAM with gate-induced drain leakage operation

Jongmin Ha, Jae Yoon Lee, Myeongseon Kim, Seongjae Cho, Il Hwan Cho

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

In this paper, we propose a double-gate one-transistor dynamic random-access memory (1T DRAM) with middle partial insulation (MPI) structure for low power application. Low power operation with the gate-induced drain leakage (GIDL) programming method can be obtained while maintaining the original advantages of MPI 1TDRAM. The optimization of the MPI 1T-DRAM device for the GIDL method is investigated with technology computer-aided design (TCAD). High current ratio and low power consumption are obtained from the proposed 1T-DRAM device. Optimal device design in terms of barrier insulator length and fin width have been carried out for improvements of device performances and reliability.

Original languageEnglish
Pages (from-to)165-171
Number of pages7
JournalJournal of Semiconductor Technology and Science
Volume19
Issue number2
DOIs
StatePublished - Apr 2019

Bibliographical note

Funding Information:
This work was supported by the 2018 research fund of Myongji University in Korea and by the Ministry of Trade, Industry and Energy (MOTIE) and the Korean Semiconductor Research Consortium (KSRC) through the Development of Next-Generation Semiconductor Devices Program (Grant No. 10080513).

Publisher Copyright:
© 2019, Institute of Electronics Engineers of Korea. All rights reserved.

Keywords

  • 1T DRAM
  • Gate-induced drain leakage (GIDL)
  • Middle partial insulation
  • TCAD

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