Intra-unit-cell electronic nematicity of the high-T c copper-oxide pseudogap states

M. J. Lawler, K. Fujita, Jhinhwan Lee, A. R. Schmidt, Y. Kohsaka, Chung Koo Kim, H. Eisaki, S. Uchida, J. C. Davis, J. P. Sethna, Eun Ah Kim

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