Intra-unit-cell electronic nematicity of the high-T c copper-oxide pseudogap states
- M. J. Lawler
- , K. Fujita
- , Jhinhwan Lee
- , A. R. Schmidt
- , Y. Kohsaka
- , Chung Koo Kim
- , H. Eisaki
- , S. Uchida
- , J. C. Davis
- , J. P. Sethna
- , Eun Ah Kim
Research output: Contribution to journal › Article › peer-review
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