TY - GEN
T1 - Inter-class test technique between black-box-class and white-box-class for component customization failures
AU - Yoon, Hoijin
AU - Choi, Byungju
N1 - Publisher Copyright:
© 1999 IEEE.
PY - 1999
Y1 - 1999
N2 - For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.
AB - For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.
KW - Component customization testing
KW - component-based development
KW - component-based fault injection
UR - http://www.scopus.com/inward/record.url?scp=0010321438&partnerID=8YFLogxK
U2 - 10.1109/APSEC.1999.809597
DO - 10.1109/APSEC.1999.809597
M3 - Conference contribution
AN - SCOPUS:0010321438
T3 - Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999
SP - 162
EP - 165
BT - Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th Asia Pacific Software Engineering Conference, APSEC 1999
Y2 - 7 December 1999 through 10 December 1999
ER -