Inter-class test technique between black-box-class and white-box-class for component customization failures

Hoijin Yoon; Byungju Choi

doi:10.1109/APSEC.1999.809597

Inter-class test technique between black-box-class and white-box-class for component customization failures

Hoijin Yoon, Byungju Choi

Computer Science & Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.

Original language	English
Title of host publication	Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	162-165
Number of pages	4
ISBN (Electronic)	0769505090, 9780769505091
DOIs	https://doi.org/10.1109/APSEC.1999.809597
State	Published - 1999
Event	6th Asia Pacific Software Engineering Conference, APSEC 1999 - Takamatsu, Japan Duration: 7 Dec 1999 → 10 Dec 1999

Publication series

Name	Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999

Conference

Conference	6th Asia Pacific Software Engineering Conference, APSEC 1999
Country/Territory	Japan
City	Takamatsu
Period	7/12/99 → 10/12/99

Keywords

Component customization testing
component-based development
component-based fault injection

Access to Document

10.1109/APSEC.1999.809597

Cite this

Yoon, H., & Choi, B. (1999). Inter-class test technique between black-box-class and white-box-class for component customization failures. In Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999 (pp. 162-165). Article 809597 (Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APSEC.1999.809597

@inproceedings{2715ba739d7849768d78a220d510ada8,

title = "Inter-class test technique between black-box-class and white-box-class for component customization failures",

abstract = "For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.",

keywords = "Component customization testing, component-based development, component-based fault injection",

author = "Hoijin Yoon and Byungju Choi",

note = "Publisher Copyright: {\textcopyright} 1999 IEEE.; 6th Asia Pacific Software Engineering Conference, APSEC 1999 ; Conference date: 07-12-1999 Through 10-12-1999",

year = "1999",

doi = "10.1109/APSEC.1999.809597",

language = "English",

series = "Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "162--165",

booktitle = "Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999",

}

Yoon, H & Choi, B 1999, Inter-class test technique between black-box-class and white-box-class for component customization failures. in Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999., 809597, Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999, Institute of Electrical and Electronics Engineers Inc., pp. 162-165, 6th Asia Pacific Software Engineering Conference, APSEC 1999, Takamatsu, Japan, 7/12/99. https://doi.org/10.1109/APSEC.1999.809597

Inter-class test technique between black-box-class and white-box-class for component customization failures. / Yoon, Hoijin; Choi, Byungju.
Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999. Institute of Electrical and Electronics Engineers Inc., 1999. p. 162-165 809597 (Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Inter-class test technique between black-box-class and white-box-class for component customization failures

AU - Yoon, Hoijin

AU - Choi, Byungju

PY - 1999

Y1 - 1999

N2 - For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.

AB - For software component customization failures, we propose an inter-class test technique between the black-box class, which represents the 'implementation', and the white-box class, which is the 'interface' for the component. Our proposed test technique is based on a fault injection technique where a fault is injected into the component interface. For our technique, we first extract the component customization patterns and fault injection targets. We then define the fault injection operators which are applied to the fault injection targets. Since the fault injection operators can cover all possible failures that can occur within component customization, the proposed testing technique is suitable for component customization testing.

KW - Component customization testing

KW - component-based development

KW - component-based fault injection

UR - http://www.scopus.com/inward/record.url?scp=0010321438&partnerID=8YFLogxK

U2 - 10.1109/APSEC.1999.809597

DO - 10.1109/APSEC.1999.809597

M3 - Conference contribution

AN - SCOPUS:0010321438

T3 - Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999

SP - 162

EP - 165

BT - Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 6th Asia Pacific Software Engineering Conference, APSEC 1999

Y2 - 7 December 1999 through 10 December 1999

ER -

Yoon H, Choi B. Inter-class test technique between black-box-class and white-box-class for component customization failures. In Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999. Institute of Electrical and Electronics Engineers Inc. 1999. p. 162-165. 809597. (Proceedings - 6th Asia Pacific Software Engineering Conference, APSEC 1999). doi: 10.1109/APSEC.1999.809597

Inter-class test technique between black-box-class and white-box-class for component customization failures

Abstract

Publication series

Conference

Keywords

Access to Document

Fingerprint

Cite this