Integrated atomistic modelling of interstitial defect growth in silicon

Sangheon Lee, Robert J. Bondi, Gyeong S. Hwang

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Integrated atomistic modelling of interstitial defect growth in silicon'. Together they form a unique fingerprint.

Engineering

Physics

Material Science