Indirect probing of defects in unipolar resistive switching NiOx thin films by Ni K-edge resonant inelastic X-ray scattering

  • Ranju Jung
  • , Soo Hyon Phark
  • , Dong Wook Kim
  • , Mary Upton
  • , Diego Casa
  • , Thomas Gog
  • , Jungho Kim

Research output: Contribution to journal › Article › peer-review

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