Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films
- B. H. Park
- , S. J. Hyun
- , C. R. Moon
- , Byung Doo Choe
- , J. Lee
- , C. Y. Kim
- , W. Jo
- , T. W. Noh
Research output: Contribution to journal › Article › peer-review
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