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Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films
B. H. Park, S. J. Hyun, C. R. Moon, Byung Doo Choe, J. Lee, C. Y. Kim, W. Jo, T. W. Noh
Research output: Contribution to journal › Article › peer-review
63
Scopus
citations