Skip to main navigation Skip to search Skip to main content

Highly uniform and reliable resistive switching characteristics of a Ni/WOx/p+-Si memory device

  • Tae Hyeon Kim
  • , Sungjun Kim
  • , Hyungjin Kim
  • , Min Hwi Kim
  • , Suhyun Bang
  • , Seongjae Cho
  • , Byung Gook Park

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Highly uniform and reliable resistive switching characteristics of a Ni/WOx/p+-Si memory device'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science

Physics