High cell-efficiency synchronous MRAM adopting unified bit-line cache

  • D. J. Kim
  • , J. H. Ko
  • , C. H. Cho
  • , Y. I. Park
  • , D. W. Kang
  • , K. S. Min
  • , D. M. Kim
  • , S. J. Lee
  • , H. S. Shin

Research output: Contribution to journalArticlepeer-review

Abstract

Unlike the 1T1C cell of the DRAM that suffers the crucial limitation on the bit-line capacitance, the stored information in the couple of the magnetic-tunnel-junction (MTJ) cell is not related to the bit-line capacitance. To achieve the high cell efficiency for the synchronous magneto-resistive random access memory (MRAM), the unified bit-line cache scheme is proposed. It simplifies the column path and provides the low-latency column operations.

Original languageEnglish
Pages (from-to)1166-1167
Number of pages2
JournalElectronics Letters
Volume39
Issue number16
DOIs
StatePublished - 7 Aug 2003

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