Abstract
Thin films (∼30 nm) of amorphous RuP alloys (P ∼ 15-20%) can be grown by CVD from the single source precursor cis-H2Ru(PMe3)4 at 250-300 °C and 200 mTorr pressure on native SiO2.
| Original language | English |
|---|---|
| Pages (from-to) | 16510-16511 |
| Number of pages | 2 |
| Journal | Journal of the American Chemical Society |
| Volume | 128 |
| Issue number | 51 |
| DOIs | |
| State | Published - 27 Dec 2006 |
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