Abstract
The dependence of band intensities in the Raman spectrum of individual single-crystal ruthenium dioxide (RuO2) nanowires on the angle between the plane of polarization of the exciting (and collected) light and the long axis of the nanowire, is shown to be a simple, complementary technique to high resolution transmission electron microscopy (HRTEM) for determining nanowire growth direction. We show that excellent agreement exists between what is observed and what is predicted for the polarization angle dependence of the intensities of the nanowires' Eg (525 cm-1) and the B2g (714 cm-1) Raman bands, only by assuming that the nanowires grow along the (001) crystallographic direction, as confirmed by HRTEM.
Original language | English |
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Article number | 213108 |
Journal | Applied Physics Letters |
Volume | 96 |
Issue number | 21 |
DOIs | |
State | Published - 24 May 2010 |
Bibliographical note
Funding Information:We gratefully acknowledge the financial support from the Partnership for International Research and Education—for Electronic Chemistry and Catalysis at Interfaces—NSF Grant No. OISE-0530268. This work was supported by the Ewha Womans University Research Grant of 2009.