Grain boundary control for high-reliability HfO2-based RRAM
- Dong Geun Jeong
- , Eunpyo Park
- , Yooyeon Jo
- , Eunyeong Yang
- , Gichang Noh
- , Dae Kyu Lee
- , Min Jee Kim
- , Yeon Joo Jeong
- , Hyun Jae Jang
- , Daniel J. Joe
- , Jiwon Chang
- , Joon Young Kwak
Research output: Contribution to journal › Article › peer-review
14
Scopus
citations