Grain boundary control for high-reliability HfO2-based RRAM

Dong Geun Jeong, Eunpyo Park, Yooyeon Jo, Eunyeong Yang, Gichang Noh, Dae Kyu Lee, Min Jee Kim, Yeon Joo Jeong, Hyun Jae Jang, Daniel J. Joe, Jiwon Chang, Joon Young Kwak

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