Film thickness effect on the properties of interconnection between YBCO and SI for superconductor and semiconductor integration
- Y. S. Jeong
- , J. H. Park
- , D. S. Eun
- , S. Y. Lee
- , C. H. Kim
- , T. S. Hahn
- , J. Y. Kim
- , I. S. Yang
Research output: Contribution to journal › Article › peer-review