FCSS: Fully convolutional self-similarity for dense semantic correspondence

Seungryong Kim, Dongbo Min, Bumsub Ham, Sangryul Jeon, Stephen Lin, Kwanghoon Sohn

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

97 Scopus citations

Abstract

We present a descriptor, called fully convolutional self-similarity (FCSS), for dense semantic correspondence. To robustly match points among different instances within the same object class, we formulate FCSS using local self-similarity (LSS) within a fully convolutional network. In contrast to existing CNN-based descriptors, FCSS is inherently insensitive to intra-class appearance variations because of its LSS-based structure, while maintaining the precise localization ability of deep neural networks. The sampling patterns of local structure and the self-similarity measure are jointly learned within the proposed network in an end-to-end and multi-scale manner. As training data for semantic correspondence is rather limited, we propose to leverage object candidate priors provided in existing image datasets and also correspondence consistency between object pairs to enable weakly-supervised learning. Experiments demonstrate that FCSS outperforms conventional handcrafted descriptors and CNN-based descriptors on various benchmarks.

Original languageEnglish
Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages616-625
Number of pages10
ISBN (Electronic)9781538604571
DOIs
StatePublished - 6 Nov 2017
Event30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017 - Honolulu, United States
Duration: 21 Jul 201726 Jul 2017

Publication series

NameProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Volume2017-January

Conference

Conference30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Country/TerritoryUnited States
CityHonolulu
Period21/07/1726/07/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

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