Extreme-Pressure Imprint Lithography for Heat and Ultraviolet-Free Direct Patterning of Rigid Nanoscale Features
- Woon Ik Park
- , Tae Wan Park
- , Young Joong Choi
- , Sangryun Lee
- , Seunghwa Ryu
- , Xiaogan Liang
- , Yeon Sik Jung
Research output: Contribution to journal › Article › peer-review
21
Scopus
citations